We present the recently developed technique of Dark Field X-Ray Microscopy that\nutilizes the diffraction of hard X-rays from individual grains or subgrains at the (sub)micro metre scale\nembedded within mm-sized samples. By magnifying the diffracted signal, 3D mapping of\norientations and strains inside the selected grain is performed with an angular resolution of\n0.005o and a spatial resolution of 200 nm. Furthermore, the speed of the measurements at high intensity\nsynchrotron facilities allows for fast non-destructive in situ determination of structural\nchanges induced by annealing or other external influences. The capabilities of Dark Field X Ray\nMicroscopy are illustrated by examples from an ongoing study of recrystallization of 50%\ncold-rolled Al1050 specimens.
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